From b049b1b0149000ce45fc2ccfe67d1df7271581cf Mon Sep 17 00:00:00 2001 From: Roger Dingledine Date: Sun, 17 Sep 2006 06:18:06 +0000 Subject: [PATCH] build testing circuits more rapidly. this has a failure mode where if circuits fail quickly, we'll fail a lot of them very quickly and not retry for a while. so be it. svn:r8407 --- src/or/circuituse.c | 8 ++++---- 1 file changed, 4 insertions(+), 4 deletions(-) diff --git a/src/or/circuituse.c b/src/or/circuituse.c index 5ac48047df..2010aa4188 100644 --- a/src/or/circuituse.c +++ b/src/or/circuituse.c @@ -653,12 +653,12 @@ circuit_testing_opened(origin_circuit_t *circ) static void circuit_testing_failed(origin_circuit_t *circ, int at_last_hop) { - if (server_mode(get_options()) && check_whether_orport_reachable()) - return; - log_info(LD_GENERAL, "Our testing circuit (to see if your ORPort is reachable) " - "has failed. I'll try again later."); + "has failed. Considering launching another one."); + + if (!circuit_enough_testing_circs()) + consider_testing_reachability(1, 0); /* These aren't used yet. */ (void)circ;