From 134ac8059b18551e37f5b298f5a6362f07fa3ea7 Mon Sep 17 00:00:00 2001 From: Nick Mathewson Date: Mon, 26 Oct 2009 22:18:05 -0400 Subject: [PATCH] Fix the very noisy unit test memory leak of CID 420-421. On any failing case in test_util_config_line, we would leak a couple of strings. --- src/test/test_util.c | 5 +++-- 1 file changed, 3 insertions(+), 2 deletions(-) diff --git a/src/test/test_util.c b/src/test/test_util.c index 64f733581b..51b788e725 100644 --- a/src/test/test_util.c +++ b/src/test/test_util.c @@ -88,7 +88,7 @@ static void test_util_config_line(void) { char buf[1024]; - char *k, *v; + char *k=NULL, *v=NULL; const char *str; /* Test parse_config_line_from_str */ @@ -161,7 +161,8 @@ test_util_config_line(void) tor_free(k); tor_free(v); test_streq(str, ""); done: - ; + tor_free(k); + tor_free(v); } /** Test basic string functionality. */